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IEC60065 IEC60950 Short Access Test Probe

HK LEE HING INDUSTRY CO., LIMITED
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IEC60065 IEC60950 Short Access Test Probe

Place of Origin : China

Brand Name : Julixing

Certification : ISO 17025 CNAS Test Report

Model Number : LX-913

Transportation : DHL Express

MOQ : 1 set

Price : Contacts us

Packaging Details : Standard packing

Delivery Time : 7~9 working days

Payment Terms : T/T,Western Union

Supply Ability : 500 Set per month

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IEC 61032 Test Probe 13 meets IEC CSA & UL requirements

 

This pin probe is intended to verify the protection against access to hazardous live parts in class 0 equipment and class II equipment (see IEC60536).

 

Conforms to:

Standard IEC61032-1997, IEC60529-2001, GB/T4208-2008 and UL etc.

 

Technical Parameter:

 

Test probe diameter                                3mm     
Test probe length      15mm
Baffle plate thickness      4mm
Baffle plate diameter      25mm
Handle length      20mm
Handle diameter     10mm

 

 

 

 

Company introduction

 

Shenzhen Julixing Instruments Co., Ltd. are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.


If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.


We would appreciate your comments on the layout design, presentation or other aspects of our website.

Website: http://www.china-item.com

 

Contact information

Contacts: Eason Wang

E-mail: sales@china-item.com

TEL: +86-755-33168386

FAX: +86-755-61605199

Phone: +86-13751010017

SKYPE: carlisle.wyk

Website: http://www.china-item.com/

 

 


 


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